A closed-loop approach to reducing scan errors in nanopositioning platforms

Sumeet Sunil Aphale, Bharath Bhikkaji, S. O. R. Moheimani

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)
Original languageEnglish
Title of host publicationProceedings of the 17th IFAC World Congress, Korea, 2008
EditorsM.J. Chung, P. Misra
Publication statusPublished - 2008

Cite this

Aphale, S. S., Bhikkaji, B., & Moheimani, S. O. R. (2008). A closed-loop approach to reducing scan errors in nanopositioning platforms. In M. J. Chung, & P. Misra (Eds.), Proceedings of the 17th IFAC World Congress, Korea, 2008

A closed-loop approach to reducing scan errors in nanopositioning platforms. / Aphale, Sumeet Sunil; Bhikkaji, Bharath; Moheimani, S. O. R.

Proceedings of the 17th IFAC World Congress, Korea, 2008. ed. / M.J. Chung; P. Misra. 2008.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Aphale, SS, Bhikkaji, B & Moheimani, SOR 2008, A closed-loop approach to reducing scan errors in nanopositioning platforms. in MJ Chung & P Misra (eds), Proceedings of the 17th IFAC World Congress, Korea, 2008.
Aphale SS, Bhikkaji B, Moheimani SOR. A closed-loop approach to reducing scan errors in nanopositioning platforms. In Chung MJ, Misra P, editors, Proceedings of the 17th IFAC World Congress, Korea, 2008. 2008
Aphale, Sumeet Sunil ; Bhikkaji, Bharath ; Moheimani, S. O. R. / A closed-loop approach to reducing scan errors in nanopositioning platforms. Proceedings of the 17th IFAC World Congress, Korea, 2008. editor / M.J. Chung ; P. Misra. 2008.
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