A closed-loop approach to reducing scan errors in nanopositioning platforms

Sumeet Sunil Aphale, Bharath Bhikkaji, S. O. R. Moheimani

Research output: Chapter in Book/Report/Conference proceedingPublished conference contribution

1 Citation (Scopus)
Original languageEnglish
Title of host publicationProceedings of the 17th IFAC World Congress, Korea, 2008
EditorsM.J. Chung, P. Misra
Publication statusPublished - 2008

Cite this