A fast resistance measurement system for impedance tomography using a bipolar DC pulse method

J. J. A. Van Weereld, D. A. L. Collie, Michael Antony Player

Research output: Contribution to journalArticle

12 Citations (Scopus)
Original languageEnglish
Pages (from-to)1-10
Number of pages9
JournalMeasurement Science and Technology
Volume12
Issue number8
DOIs
Publication statusPublished - Aug 2001

Cite this