A novel X-ray diffractometer to study the texture of materials

C. C. Tang*, M. C. Miller, S. M. Clark, M. A. Player, G. R.G. Craib

*Corresponding author for this work

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

An X-ray energy-dispersive diffraction technique to study the texture of materials using synchrotron radiation has been developed. The design and commissioning of the diffraction instrument are described. The technique was first applied to study a drawn-wire aluminium sample which has a well known deformation texture. To demonstrate its capability further, results obtained from an erbium evaporated thin film are also presented.

Original languageEnglish
Pages (from-to)6-13
Number of pages8
JournalJournal of synchrotron radiation
Volume3
Issue number1
DOIs
Publication statusPublished - 1996

Fingerprint

Diffractometers
diffractometers
textures
Textures
Diffraction
X rays
Erbium
Synchrotron radiation
diffraction
erbium
synchrotron radiation
x rays
wire
Wire
aluminum
Aluminum
Thin films
thin films
energy

Keywords

  • Aluminium drawn wire
  • Erbium thin film
  • Real-time data acquisition
  • Texture analysis
  • X-ray energy-dispersive technique

ASJC Scopus subject areas

  • Radiation
  • Nuclear and High Energy Physics
  • Instrumentation

Cite this

A novel X-ray diffractometer to study the texture of materials. / Tang, C. C.; Miller, M. C.; Clark, S. M.; Player, M. A.; Craib, G. R.G.

In: Journal of synchrotron radiation, Vol. 3, No. 1, 1996, p. 6-13.

Research output: Contribution to journalArticle

Tang, C. C. ; Miller, M. C. ; Clark, S. M. ; Player, M. A. ; Craib, G. R.G. / A novel X-ray diffractometer to study the texture of materials. In: Journal of synchrotron radiation. 1996 ; Vol. 3, No. 1. pp. 6-13.
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