A topological data analysis based classification method for multiple measurements

Henri Riihimäki, Wojciech Chachólski, Jakob Theorell, Jan Hillert, Ryan Ramanujam* (Corresponding Author)

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

14 Citations (Scopus)
5 Downloads (Pure)

Fingerprint

Dive into the research topics of 'A topological data analysis based classification method for multiple measurements'. Together they form a unique fingerprint.

Mathematics

Medicine & Life Sciences

Engineering & Materials Science

Chemical Compounds