Characterization of evaporated erbium films at various stages of growth

E. D. Gu*, H. Savaloni, M. A. Player, G. V. Marr

*Corresponding author for this work

Research output: Contribution to journalArticle

19 Citations (Scopus)

Abstract

In this paper, the phases and structure of evaporated erbium films at various stages of growth and the influence of deposition conditions including deposition rate, residual gases, substrate temperature, and substrate material on these films are investigated. In accordance with the findings of other workers, our experiments show that under typlcal UHV conditions and at ambient temperature the thinner erbium films are erbium dihydride with f.c.c. structure rather than erbium metal. However, if residual hydrogen and water vapour are reduced, ultra-thin pure erbium films with h.c.p. structure can be prepared. For films deposited onto high temperature substrates (356°C), the films are strongly influenced by substrate material; thicker films deposited on glass substrates contain mainly h.c.p. erbium metal, whereas the thicker films deposited on carbon substrates show amorphous nature. Erbium oxide is found in the thinner films deposited at high temperature on both glass and carbon substrates. At both ambient and high substrate temperatures, the 〈001〉 preferred o rientation of erbium metal crystallites with h.c.p. structure is found even at their earliest stages of growth.

Original languageEnglish
Pages (from-to)127-136
Number of pages10
JournalJournal of Physics and Chemistry of Solids
Volume53
Issue number1
DOIs
Publication statusPublished - 1 Jan 1992

Fingerprint

Erbium
erbium
Substrates
Metals
Thick films
thick films
Carbon
Temperature
metals
Glass
dihydrides
residual gas
glass
carbon
Steam
Deposition rates
Crystallites
Water vapor
crystallites
ambient temperature

Keywords

  • electron-beam evaporation
  • erbium dihydride
  • erbium film
  • erbium oxide
  • Rare earth metal

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics

Cite this

Characterization of evaporated erbium films at various stages of growth. / Gu, E. D.; Savaloni, H.; Player, M. A.; Marr, G. V.

In: Journal of Physics and Chemistry of Solids, Vol. 53, No. 1, 01.01.1992, p. 127-136.

Research output: Contribution to journalArticle

@article{c759c18497e247b58b5798baeb886376,
title = "Characterization of evaporated erbium films at various stages of growth",
abstract = "In this paper, the phases and structure of evaporated erbium films at various stages of growth and the influence of deposition conditions including deposition rate, residual gases, substrate temperature, and substrate material on these films are investigated. In accordance with the findings of other workers, our experiments show that under typlcal UHV conditions and at ambient temperature the thinner erbium films are erbium dihydride with f.c.c. structure rather than erbium metal. However, if residual hydrogen and water vapour are reduced, ultra-thin pure erbium films with h.c.p. structure can be prepared. For films deposited onto high temperature substrates (356°C), the films are strongly influenced by substrate material; thicker films deposited on glass substrates contain mainly h.c.p. erbium metal, whereas the thicker films deposited on carbon substrates show amorphous nature. Erbium oxide is found in the thinner films deposited at high temperature on both glass and carbon substrates. At both ambient and high substrate temperatures, the 〈001〉 preferred o rientation of erbium metal crystallites with h.c.p. structure is found even at their earliest stages of growth.",
keywords = "electron-beam evaporation, erbium dihydride, erbium film, erbium oxide, Rare earth metal",
author = "Gu, {E. D.} and H. Savaloni and Player, {M. A.} and Marr, {G. V.}",
year = "1992",
month = "1",
day = "1",
doi = "10.1016/0022-3697(92)90020-E",
language = "English",
volume = "53",
pages = "127--136",
journal = "Journal of Physics and Chemistry of Solids",
issn = "0022-3697",
publisher = "Elsevier Ltd",
number = "1",

}

TY - JOUR

T1 - Characterization of evaporated erbium films at various stages of growth

AU - Gu, E. D.

AU - Savaloni, H.

AU - Player, M. A.

AU - Marr, G. V.

PY - 1992/1/1

Y1 - 1992/1/1

N2 - In this paper, the phases and structure of evaporated erbium films at various stages of growth and the influence of deposition conditions including deposition rate, residual gases, substrate temperature, and substrate material on these films are investigated. In accordance with the findings of other workers, our experiments show that under typlcal UHV conditions and at ambient temperature the thinner erbium films are erbium dihydride with f.c.c. structure rather than erbium metal. However, if residual hydrogen and water vapour are reduced, ultra-thin pure erbium films with h.c.p. structure can be prepared. For films deposited onto high temperature substrates (356°C), the films are strongly influenced by substrate material; thicker films deposited on glass substrates contain mainly h.c.p. erbium metal, whereas the thicker films deposited on carbon substrates show amorphous nature. Erbium oxide is found in the thinner films deposited at high temperature on both glass and carbon substrates. At both ambient and high substrate temperatures, the 〈001〉 preferred o rientation of erbium metal crystallites with h.c.p. structure is found even at their earliest stages of growth.

AB - In this paper, the phases and structure of evaporated erbium films at various stages of growth and the influence of deposition conditions including deposition rate, residual gases, substrate temperature, and substrate material on these films are investigated. In accordance with the findings of other workers, our experiments show that under typlcal UHV conditions and at ambient temperature the thinner erbium films are erbium dihydride with f.c.c. structure rather than erbium metal. However, if residual hydrogen and water vapour are reduced, ultra-thin pure erbium films with h.c.p. structure can be prepared. For films deposited onto high temperature substrates (356°C), the films are strongly influenced by substrate material; thicker films deposited on glass substrates contain mainly h.c.p. erbium metal, whereas the thicker films deposited on carbon substrates show amorphous nature. Erbium oxide is found in the thinner films deposited at high temperature on both glass and carbon substrates. At both ambient and high substrate temperatures, the 〈001〉 preferred o rientation of erbium metal crystallites with h.c.p. structure is found even at their earliest stages of growth.

KW - electron-beam evaporation

KW - erbium dihydride

KW - erbium film

KW - erbium oxide

KW - Rare earth metal

UR - http://www.scopus.com/inward/record.url?scp=0038527450&partnerID=8YFLogxK

U2 - 10.1016/0022-3697(92)90020-E

DO - 10.1016/0022-3697(92)90020-E

M3 - Article

AN - SCOPUS:0038527450

VL - 53

SP - 127

EP - 136

JO - Journal of Physics and Chemistry of Solids

JF - Journal of Physics and Chemistry of Solids

SN - 0022-3697

IS - 1

ER -