Extended x-ray absorption fine structure studies of structure and short-range order in C-Er bilayer and Er/C multilayer films

M. A. Player*, G. V. Marr, E. Gu, H. Savaloni, I. H. Munro

*Corresponding author for this work

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

Glancing angle extended x-ray absorption fine structure (EXAFS) has been applied to study structure, diffusion, and short-range order in ultrahigh vacuum evaporated C-Er bilayer and Er/C multilayer films, which provide a model for the influence of microstructure in x-ray multilayer reflectors. A lack of crystallinity in the C-Er bilayers and Er/C multilayers is indicated by x-ray diffraction. EXAFS spectra of C-Er bilayers and Er/C multilayers are substantially different from that of a 6000-Å erbium film, which shows local structure similar to pure erbium. For bilayers and multilayers a local ErC2-like environment has been found, even though only a small concentration of carbon is thought to have diffused into erbium layers. It is possible that carbon diffusion and Er - C bond formation prevent the crystallization of locally ordered hcp erbium metal clusters. That low Z atoms can diffuse into the high Z metal layers and change their structure appears to be a common feature for x-ray multilayer mirrors.

Original languageEnglish
Pages (from-to)1474-1477
Number of pages4
JournalReview of Scientific Instruments
Volume63
Issue number1
DOIs
Publication statusPublished - Jan 1992

Fingerprint

Multilayer films
x ray absorption
erbium
Erbium
Multilayers
fine structure
X rays
carbon
metal clusters
Carbon
ultrahigh vacuum
reflectors
Ultrahigh vacuum
crystallinity
Metals
x ray diffraction
x rays
crystallization
mirrors
microstructure

ASJC Scopus subject areas

  • Instrumentation

Cite this

Extended x-ray absorption fine structure studies of structure and short-range order in C-Er bilayer and Er/C multilayer films. / Player, M. A.; Marr, G. V.; Gu, E.; Savaloni, H.; Munro, I. H.

In: Review of Scientific Instruments, Vol. 63, No. 1, 01.1992, p. 1474-1477.

Research output: Contribution to journalArticle

@article{7096bec9d15b440a8c2f38f37c93ec1d,
title = "Extended x-ray absorption fine structure studies of structure and short-range order in C-Er bilayer and Er/C multilayer films",
abstract = "Glancing angle extended x-ray absorption fine structure (EXAFS) has been applied to study structure, diffusion, and short-range order in ultrahigh vacuum evaporated C-Er bilayer and Er/C multilayer films, which provide a model for the influence of microstructure in x-ray multilayer reflectors. A lack of crystallinity in the C-Er bilayers and Er/C multilayers is indicated by x-ray diffraction. EXAFS spectra of C-Er bilayers and Er/C multilayers are substantially different from that of a 6000-{\AA} erbium film, which shows local structure similar to pure erbium. For bilayers and multilayers a local ErC2-like environment has been found, even though only a small concentration of carbon is thought to have diffused into erbium layers. It is possible that carbon diffusion and Er - C bond formation prevent the crystallization of locally ordered hcp erbium metal clusters. That low Z atoms can diffuse into the high Z metal layers and change their structure appears to be a common feature for x-ray multilayer mirrors.",
author = "Player, {M. A.} and Marr, {G. V.} and E. Gu and H. Savaloni and Munro, {I. H.}",
year = "1992",
month = "1",
doi = "10.1063/1.1143046",
language = "English",
volume = "63",
pages = "1474--1477",
journal = "Review of Scientific Instruments",
issn = "0034-6748",
publisher = "American Institute of Physics Publising LLC",
number = "1",

}

TY - JOUR

T1 - Extended x-ray absorption fine structure studies of structure and short-range order in C-Er bilayer and Er/C multilayer films

AU - Player, M. A.

AU - Marr, G. V.

AU - Gu, E.

AU - Savaloni, H.

AU - Munro, I. H.

PY - 1992/1

Y1 - 1992/1

N2 - Glancing angle extended x-ray absorption fine structure (EXAFS) has been applied to study structure, diffusion, and short-range order in ultrahigh vacuum evaporated C-Er bilayer and Er/C multilayer films, which provide a model for the influence of microstructure in x-ray multilayer reflectors. A lack of crystallinity in the C-Er bilayers and Er/C multilayers is indicated by x-ray diffraction. EXAFS spectra of C-Er bilayers and Er/C multilayers are substantially different from that of a 6000-Å erbium film, which shows local structure similar to pure erbium. For bilayers and multilayers a local ErC2-like environment has been found, even though only a small concentration of carbon is thought to have diffused into erbium layers. It is possible that carbon diffusion and Er - C bond formation prevent the crystallization of locally ordered hcp erbium metal clusters. That low Z atoms can diffuse into the high Z metal layers and change their structure appears to be a common feature for x-ray multilayer mirrors.

AB - Glancing angle extended x-ray absorption fine structure (EXAFS) has been applied to study structure, diffusion, and short-range order in ultrahigh vacuum evaporated C-Er bilayer and Er/C multilayer films, which provide a model for the influence of microstructure in x-ray multilayer reflectors. A lack of crystallinity in the C-Er bilayers and Er/C multilayers is indicated by x-ray diffraction. EXAFS spectra of C-Er bilayers and Er/C multilayers are substantially different from that of a 6000-Å erbium film, which shows local structure similar to pure erbium. For bilayers and multilayers a local ErC2-like environment has been found, even though only a small concentration of carbon is thought to have diffused into erbium layers. It is possible that carbon diffusion and Er - C bond formation prevent the crystallization of locally ordered hcp erbium metal clusters. That low Z atoms can diffuse into the high Z metal layers and change their structure appears to be a common feature for x-ray multilayer mirrors.

UR - http://www.scopus.com/inward/record.url?scp=5244219767&partnerID=8YFLogxK

U2 - 10.1063/1.1143046

DO - 10.1063/1.1143046

M3 - Article

AN - SCOPUS:5244219767

VL - 63

SP - 1474

EP - 1477

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 0034-6748

IS - 1

ER -