Abstract
Glancing angle extended x-ray absorption fine structure (EXAFS) has been applied to study structure, diffusion, and short-range order in ultrahigh vacuum evaporated C-Er bilayer and Er/C multilayer films, which provide a model for the influence of microstructure in x-ray multilayer reflectors. A lack of crystallinity in the C-Er bilayers and Er/C multilayers is indicated by x-ray diffraction. EXAFS spectra of C-Er bilayers and Er/C multilayers are substantially different from that of a 6000-Å erbium film, which shows local structure similar to pure erbium. For bilayers and multilayers a local ErC2-like environment has been found, even though only a small concentration of carbon is thought to have diffused into erbium layers. It is possible that carbon diffusion and Er - C bond formation prevent the crystallization of locally ordered hcp erbium metal clusters. That low Z atoms can diffuse into the high Z metal layers and change their structure appears to be a common feature for x-ray multilayer mirrors.
| Original language | English |
|---|---|
| Pages (from-to) | 1474-1477 |
| Number of pages | 4 |
| Journal | Review of Scientific Instruments |
| Volume | 63 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - Jan 1992 |
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ASJC Scopus subject areas
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Extended x-ray absorption fine structure studies of structure and short-range order in C-Er bilayer and Er/C multilayer films. / Player, M. A.; Marr, G. V.; Gu, E.; Savaloni, H.; Munro, I. H.
In: Review of Scientific Instruments, Vol. 63, No. 1, 01.1992, p. 1474-1477.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Extended x-ray absorption fine structure studies of structure and short-range order in C-Er bilayer and Er/C multilayer films
AU - Player, M. A.
AU - Marr, G. V.
AU - Gu, E.
AU - Savaloni, H.
AU - Munro, I. H.
PY - 1992/1
Y1 - 1992/1
N2 - Glancing angle extended x-ray absorption fine structure (EXAFS) has been applied to study structure, diffusion, and short-range order in ultrahigh vacuum evaporated C-Er bilayer and Er/C multilayer films, which provide a model for the influence of microstructure in x-ray multilayer reflectors. A lack of crystallinity in the C-Er bilayers and Er/C multilayers is indicated by x-ray diffraction. EXAFS spectra of C-Er bilayers and Er/C multilayers are substantially different from that of a 6000-Å erbium film, which shows local structure similar to pure erbium. For bilayers and multilayers a local ErC2-like environment has been found, even though only a small concentration of carbon is thought to have diffused into erbium layers. It is possible that carbon diffusion and Er - C bond formation prevent the crystallization of locally ordered hcp erbium metal clusters. That low Z atoms can diffuse into the high Z metal layers and change their structure appears to be a common feature for x-ray multilayer mirrors.
AB - Glancing angle extended x-ray absorption fine structure (EXAFS) has been applied to study structure, diffusion, and short-range order in ultrahigh vacuum evaporated C-Er bilayer and Er/C multilayer films, which provide a model for the influence of microstructure in x-ray multilayer reflectors. A lack of crystallinity in the C-Er bilayers and Er/C multilayers is indicated by x-ray diffraction. EXAFS spectra of C-Er bilayers and Er/C multilayers are substantially different from that of a 6000-Å erbium film, which shows local structure similar to pure erbium. For bilayers and multilayers a local ErC2-like environment has been found, even though only a small concentration of carbon is thought to have diffused into erbium layers. It is possible that carbon diffusion and Er - C bond formation prevent the crystallization of locally ordered hcp erbium metal clusters. That low Z atoms can diffuse into the high Z metal layers and change their structure appears to be a common feature for x-ray multilayer mirrors.
UR - http://www.scopus.com/inward/record.url?scp=5244219767&partnerID=8YFLogxK
U2 - 10.1063/1.1143046
DO - 10.1063/1.1143046
M3 - Article
AN - SCOPUS:5244219767
VL - 63
SP - 1474
EP - 1477
JO - Review of Scientific Instruments
JF - Review of Scientific Instruments
SN - 0034-6748
IS - 1
ER -