Fabrication and X-ray diffraction studies of Er/C multilayer films

E. Gu*, M. A. Player, G. V. Marr, H. Savaloni

*Corresponding author for this work

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Abstract

A new rare earth metal multilayer film with a combination of erbium and carbon has been synthesized. The structural properties of such Er/C multilayer films were characterized by X-ray diffraction. The results indicate that compositional periodic structure can be established in Er/C multilayer films and this periodic are determined to a great extent by design parameters.

Original languageEnglish
Pages (from-to)48-51
Number of pages4
JournalJournal of Magnetism and Magnetic Materials
Volume126
Issue number1-3
DOIs
Publication statusPublished - Sep 1993

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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