Fabrication and X-ray diffraction studies of Er/C multilayer films

E. Gu*, M. A. Player, G. V. Marr, H. Savaloni

*Corresponding author for this work

Research output: Contribution to journalArticle

1 Citation (Scopus)


A new rare earth metal multilayer film with a combination of erbium and carbon has been synthesized. The structural properties of such Er/C multilayer films were characterized by X-ray diffraction. The results indicate that compositional periodic structure can be established in Er/C multilayer films and this periodic are determined to a great extent by design parameters.

Original languageEnglish
Pages (from-to)48-51
Number of pages4
JournalJournal of Magnetism and Magnetic Materials
Issue number1-3
Publication statusPublished - Sep 1993


ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this