Fabrication and X-ray diffraction studies of Er/C multilayer films

E. Gu*, M. A. Player, G. V. Marr, H. Savaloni

*Corresponding author for this work

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

A new rare earth metal multilayer film with a combination of erbium and carbon has been synthesized. The structural properties of such Er/C multilayer films were characterized by X-ray diffraction. The results indicate that compositional periodic structure can be established in Er/C multilayer films and this periodic are determined to a great extent by design parameters.

Original languageEnglish
Pages (from-to)48-51
Number of pages4
JournalJournal of Magnetism and Magnetic Materials
Volume126
Issue number1-3
DOIs
Publication statusPublished - Sep 1993

Fingerprint

Multilayer films
Fabrication
X ray diffraction
fabrication
Rare Earth Metals
diffraction
Erbium
x rays
Periodic structures
erbium
Rare earths
Structural properties
rare earth elements
Carbon
carbon
Metals
metals

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Fabrication and X-ray diffraction studies of Er/C multilayer films. / Gu, E.; Player, M. A.; Marr, G. V.; Savaloni, H.

In: Journal of Magnetism and Magnetic Materials, Vol. 126, No. 1-3, 09.1993, p. 48-51.

Research output: Contribution to journalArticle

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