Impact of plasma dynamics on equivalence ratio measurements by laser-induced breakdown spectroscopy

Johannes Kiefer (Corresponding Author), Bo Zhou, Zhongshan Li, Marcus Alden

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

The systematic errors introduced by triggering a USB spectrometer for laser-induced breakdown spectroscopy
equivalence ratio measurements are studied. We analyze the temporal behavior of laser-induced plasma in a nonreacting
methane/air mixture and investigate the influence of the dynamics on equivalence ratio measurements
with gated and ungated detection. For use of gated detectors, optimal delay times were found to be between 500
and 2000 ns to allow effective suppression of interferences while maintaining sufficient signal-to-noise levels.
Good precision was found for short and long exposure time intervals when an intensified CCD camera was employed.
On the other hand, the jitter of an externally triggered ungated spectrometer leads to high uncertainties.
Running the ungated spectrometer freely, the single-shot uncertainty can be reduced by more than 1 order of
magnitude.
Original languageEnglish
Pages (from-to)4221-4226
Number of pages6
JournalApplied Optics
Volume54
Issue number13
DOIs
Publication statusPublished - 1 May 2015

Fingerprint

Laser induced breakdown spectroscopy
plasma dynamics
laser-induced breakdown spectroscopy
equivalence
Spectrometers
spectrometers
Plasmas
Lasers
Systematic errors
CCD cameras
Jitter
systematic errors
shot
lasers
Time delay
time lag
breakdown
retarding
Detectors
intervals

Cite this

Impact of plasma dynamics on equivalence ratio measurements by laser-induced breakdown spectroscopy. / Kiefer, Johannes (Corresponding Author); Zhou, Bo; Li, Zhongshan; Alden, Marcus.

In: Applied Optics, Vol. 54, No. 13, 01.05.2015, p. 4221-4226.

Research output: Contribution to journalArticle

Kiefer, Johannes ; Zhou, Bo ; Li, Zhongshan ; Alden, Marcus. / Impact of plasma dynamics on equivalence ratio measurements by laser-induced breakdown spectroscopy. In: Applied Optics. 2015 ; Vol. 54, No. 13. pp. 4221-4226.
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