Mapping optical process in semiconductor nanowires using dynamic optical tweezers

Fan Wang; Wen Jun Toe; Alexander Hartstone; Woei Ming Lee; David McGloin; Qiang Gao; Hark Hoe Tan; Chennupati Jagadish; Peter J. Reece

doi:10.1117/12.928558

Mapping optical process in semiconductor nanowires using dynamic optical tweezers

Fan Wang^*, Wen Jun Toe, Alexander Hartstone, Woei Ming Lee, David McGloin, Qiang Gao, Hark Hoe Tan, Chennupati Jagadish, Peter J. Reece

^*Corresponding author for this work

Physics

Research output: Chapter in Book/Report/Conference proceeding › Published conference contribution

Abstract

We present a novel method for spatial mapping of the luminescent properties of single optically trapped semiconductor nanowires by combing dynamic optical tweezers with micro-photoluminescence. The technique involves the use of a spatial light modulator (SLM) to control the axial position of the trapping focus relative to the excitation source and collection optics. When a nanowire is held in this arrangement, scanning the axial position of the trapping beam enables different sections of the nanowire axis to be probed. In this context we consider the axial resolution of the luminescence mapping and optimization of the nanowire trapping by spherical aberration correction.

Original language	English
Title of host publication	Proceedings: Optical Trapping and Optical Micromanipulation IX
Volume	8458
DOIs	https://doi.org/10.1117/12.928558
Publication status	Published - 2012
Event	SPIE NanoScience + Engineering : Optical Trapping and Optical Micromanipulation IX - San Diego, CA, United States Duration: 12 Aug 2012 → 16 Aug 2012

Conference

Conference	SPIE NanoScience + Engineering
Country/Territory	United States
City	San Diego, CA
Period	12/08/12 → 16/08/12

Keywords

Indium phosphide
Nanowires
Optical tweezers
Photoluminescence mapping

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10.1117/12.928558

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Wang, F, Toe, WJ, Hartstone, A, Lee, WM, McGloin, D, Gao, Q, Tan, HH, Jagadish, C & Reece, PJ 2012, Mapping optical process in semiconductor nanowires using dynamic optical tweezers. in Proceedings: Optical Trapping and Optical Micromanipulation IX. vol. 8458, 845822, SPIE NanoScience + Engineering , San Diego, CA, United States, 12/08/12. https://doi.org/10.1117/12.928558

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title = "Mapping optical process in semiconductor nanowires using dynamic optical tweezers",

abstract = "We present a novel method for spatial mapping of the luminescent properties of single optically trapped semiconductor nanowires by combing dynamic optical tweezers with micro-photoluminescence. The technique involves the use of a spatial light modulator (SLM) to control the axial position of the trapping focus relative to the excitation source and collection optics. When a nanowire is held in this arrangement, scanning the axial position of the trapping beam enables different sections of the nanowire axis to be probed. In this context we consider the axial resolution of the luminescence mapping and optimization of the nanowire trapping by spherical aberration correction.",

keywords = "Indium phosphide, Nanowires, Optical tweezers, Photoluminescence mapping",

author = "Fan Wang and Toe, {Wen Jun} and Alexander Hartstone and Lee, {Woei Ming} and David McGloin and Qiang Gao and Tan, {Hark Hoe} and Chennupati Jagadish and Reece, {Peter J.}",

year = "2012",

doi = "10.1117/12.928558",

language = "English",

isbn = "9780819491756",

volume = "8458",

booktitle = "Proceedings: Optical Trapping and Optical Micromanipulation IX",

note = "SPIE NanoScience + Engineering : Optical Trapping and Optical Micromanipulation IX ; Conference date: 12-08-2012 Through 16-08-2012",

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T1 - Mapping optical process in semiconductor nanowires using dynamic optical tweezers

AU - Wang, Fan

AU - Toe, Wen Jun

AU - Hartstone, Alexander

AU - Lee, Woei Ming

AU - McGloin, David

AU - Gao, Qiang

AU - Tan, Hark Hoe

AU - Jagadish, Chennupati

AU - Reece, Peter J.

PY - 2012

Y1 - 2012

N2 - We present a novel method for spatial mapping of the luminescent properties of single optically trapped semiconductor nanowires by combing dynamic optical tweezers with micro-photoluminescence. The technique involves the use of a spatial light modulator (SLM) to control the axial position of the trapping focus relative to the excitation source and collection optics. When a nanowire is held in this arrangement, scanning the axial position of the trapping beam enables different sections of the nanowire axis to be probed. In this context we consider the axial resolution of the luminescence mapping and optimization of the nanowire trapping by spherical aberration correction.

AB - We present a novel method for spatial mapping of the luminescent properties of single optically trapped semiconductor nanowires by combing dynamic optical tweezers with micro-photoluminescence. The technique involves the use of a spatial light modulator (SLM) to control the axial position of the trapping focus relative to the excitation source and collection optics. When a nanowire is held in this arrangement, scanning the axial position of the trapping beam enables different sections of the nanowire axis to be probed. In this context we consider the axial resolution of the luminescence mapping and optimization of the nanowire trapping by spherical aberration correction.

KW - Indium phosphide

KW - Nanowires

KW - Optical tweezers

KW - Photoluminescence mapping

UR - http://www.scopus.com/inward/record.url?scp=84872057648&partnerID=8YFLogxK

U2 - 10.1117/12.928558

DO - 10.1117/12.928558

M3 - Published conference contribution

AN - SCOPUS:84872057648

SN - 9780819491756

VL - 8458

BT - Proceedings: Optical Trapping and Optical Micromanipulation IX

T2 - SPIE NanoScience + Engineering

Y2 - 12 August 2012 through 16 August 2012

ER -

Mapping optical process in semiconductor nanowires using dynamic optical tweezers

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Keywords

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