Morphological changes in UHV deposited Er a-C films: nucleation, growth and grain structure

Hadi Savaloni*, Michael A. Player

*Corresponding author for this work

Research output: Contribution to journalArticle

15 Citations (Scopus)

Abstract

Erbium films of varying thickness (5-1.5 μm) were deposited on a-C substrates at different substrate temperatures. Microstructures of films are obtained by transmission electron microscopy and scanning electron microscopy while the selected area diffraction patterns of films are analysed using an image analyser. A phenomenological description of film growth and its morphological changes based on nucleation, mobility of clusters and a liquid-like mode of coalescence is given.

Original languageEnglish
Pages (from-to)48-58
Number of pages11
JournalThin Solid Films
Volume256
Issue number1-2
DOIs
Publication statusPublished - 1 Feb 1995

Keywords

  • Electron microscopy
  • Evaporation
  • Growth mechanism
  • Lanthanides

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry
  • Metals and Alloys
  • Surfaces, Coatings and Films
  • Surfaces and Interfaces
  • Condensed Matter Physics

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