On wafer thermal characterization of miniature gallium arsenide microcoolers with thermal loading from DC probes

J. Glover, A. Khalid, D. R. S. Cumming, M. Montes Bajo, M. Kuball, A. Stephen, G. M. Dunn, C. H. Oxley*

*Corresponding author for this work

Research output: Contribution to journalArticle

Abstract

Miniature aluminium gallium arsenide/gallium arsenide (AlGaAs/GaAs) coolers were fabricated on wafer, enabling different contact geometries to be realized in the same process run. To individually DC bias the microcooler, microprobes were used leading to thermal loading of the cooler. A simple experimental technique was developed to verify the temperature difference (Delta T) between the cold cathode and hot anode contacts is due to cooling rather than heating of the cooler. (C) 2014 Wiley Periodicals, Inc.

Original languageEnglish
Pages (from-to)2699-2700
Number of pages2
JournalMicrowave and Optical Technology Letters
Volume56
Issue number11
Early online date27 Aug 2014
DOIs
Publication statusPublished - Nov 2014

Keywords

  • electrothermal microcooler
  • GaAs
  • IR thermography
  • superlattice microcoolers

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