On wafer thermal characterization of miniature gallium arsenide microcoolers with thermal loading from DC probes

J. Glover; A. Khalid; D. R. S. Cumming; M. Montes Bajo; M. Kuball; A. Stephen; G. M. Dunn; C. H. Oxley

doi:10.1002/mop.28681

On wafer thermal characterization of miniature gallium arsenide microcoolers with thermal loading from DC probes

J. Glover, A. Khalid, D. R. S. Cumming, M. Montes Bajo, M. Kuball, A. Stephen, G. M. Dunn, C. H. Oxley^*

^*Corresponding author for this work

Physics

Research output: Contribution to journal › Article › peer-review

Abstract

Miniature aluminium gallium arsenide/gallium arsenide (AlGaAs/GaAs) coolers were fabricated on wafer, enabling different contact geometries to be realized in the same process run. To individually DC bias the microcooler, microprobes were used leading to thermal loading of the cooler. A simple experimental technique was developed to verify the temperature difference (Delta T) between the cold cathode and hot anode contacts is due to cooling rather than heating of the cooler. (C) 2014 Wiley Periodicals, Inc.

Original language	English
Pages (from-to)	2699-2700
Number of pages	2
Journal	Microwave and Optical Technology Letters
Volume	56
Issue number	11
Early online date	27 Aug 2014
DOIs	https://doi.org/10.1002/mop.28681
Publication status	Published - Nov 2014

Keywords

electrothermal microcooler
GaAs
IR thermography
superlattice microcoolers

Access to Document

10.1002/mop.28681

Geoffrey Dunn
- School of Natural & Computing Sciences, Physics - Senior Lecturer
Person: Academic

Cite this

@article{cf9f8c233d074bfc81ea4dde480377e3,

title = "On wafer thermal characterization of miniature gallium arsenide microcoolers with thermal loading from DC probes",

abstract = "Miniature aluminium gallium arsenide/gallium arsenide (AlGaAs/GaAs) coolers were fabricated on wafer, enabling different contact geometries to be realized in the same process run. To individually DC bias the microcooler, microprobes were used leading to thermal loading of the cooler. A simple experimental technique was developed to verify the temperature difference (Delta T) between the cold cathode and hot anode contacts is due to cooling rather than heating of the cooler. (C) 2014 Wiley Periodicals, Inc.",

keywords = "electrothermal microcooler, GaAs, IR thermography, superlattice microcoolers",

author = "J. Glover and A. Khalid and Cumming, {D. R. S.} and Bajo, {M. Montes} and M. Kuball and A. Stephen and Dunn, {G. M.} and Oxley, {C. H.}",

note = "ACKNOWLEDGMENT This work was supported by EPSRC through grants EP/H011366/1, EP/H011862/1, EP/H012532/1, and EP/H012966/1.",

year = "2014",

month = nov,

doi = "10.1002/mop.28681",

language = "English",

volume = "56",

pages = "2699--2700",

journal = "Microwave and Optical Technology Letters",

issn = "0895-2477",

publisher = "John Wiley and Sons Inc.",

number = "11",

}

TY - JOUR

T1 - On wafer thermal characterization of miniature gallium arsenide microcoolers with thermal loading from DC probes

AU - Glover, J.

AU - Khalid, A.

AU - Cumming, D. R. S.

AU - Bajo, M. Montes

AU - Kuball, M.

AU - Stephen, A.

AU - Dunn, G. M.

AU - Oxley, C. H.

N1 - ACKNOWLEDGMENT This work was supported by EPSRC through grants EP/H011366/1, EP/H011862/1, EP/H012532/1, and EP/H012966/1.

PY - 2014/11

Y1 - 2014/11

N2 - Miniature aluminium gallium arsenide/gallium arsenide (AlGaAs/GaAs) coolers were fabricated on wafer, enabling different contact geometries to be realized in the same process run. To individually DC bias the microcooler, microprobes were used leading to thermal loading of the cooler. A simple experimental technique was developed to verify the temperature difference (Delta T) between the cold cathode and hot anode contacts is due to cooling rather than heating of the cooler. (C) 2014 Wiley Periodicals, Inc.

AB - Miniature aluminium gallium arsenide/gallium arsenide (AlGaAs/GaAs) coolers were fabricated on wafer, enabling different contact geometries to be realized in the same process run. To individually DC bias the microcooler, microprobes were used leading to thermal loading of the cooler. A simple experimental technique was developed to verify the temperature difference (Delta T) between the cold cathode and hot anode contacts is due to cooling rather than heating of the cooler. (C) 2014 Wiley Periodicals, Inc.

KW - electrothermal microcooler

KW - GaAs

KW - IR thermography

KW - superlattice microcoolers

U2 - 10.1002/mop.28681

DO - 10.1002/mop.28681

M3 - Article

VL - 56

SP - 2699

EP - 2700

JO - Microwave and Optical Technology Letters

JF - Microwave and Optical Technology Letters

SN - 0895-2477

IS - 11

ER -

On wafer thermal characterization of miniature gallium arsenide microcoolers with thermal loading from DC probes

Abstract

Keywords

Access to Document

Fingerprint

Profiles

Geoffrey Dunn

Cite this