Optimal integral force feedback and structured pi tracking control: Application for high speed confocal microscopy

Yik R. Teo, Douglas Russell, Sumeet S. Aphale, Andrew J. Fleming

Research output: Chapter in Book/Report/Conference proceedingPublished conference contribution

5 Citations (Scopus)

Abstract

In this paper, an improvement to Integral Force Feedback (IFF) damping control is proposed. The main limitation of Integral Force Feedback is that the maximum modal damping depends on the system's parameters. Hence, for some system achievable damping is insignificant. The proposed improvement allows any arbitrary damping ratio to be achieved for a system by introducing a new feed-through term in the system. To achieve displacement tracking, one technique is to enclose the system in an integral feedback loop. However, the bandwidth is limited due to the effects of an additional pole in the damping loop. The proposed Structured PI controller is parameterised so that it contains a zero that cancel the additional pole. Experiment was conducted on a commercial objective lens positioner. The results show an exceptional tracking and damping performance and the system's insensitivity to changes in resonance frequency. The maximum bandwidth achievable with a commercial PID controller is 26.1 Hz. In contrast, with the proposed method, the bandwidth is increased to 255 Hz.

Original languageEnglish
Title of host publication19th IFAC World Congress
Subtitle of host publicationProceedings
PublisherElsevier
Pages11793-11799
Number of pages7
ISBN (Print)9783902823625
DOIs
Publication statusPublished - 2014
Event19th IFAC World Congress on International Federation of Automatic Control, IFAC 2014 - Cape Town, South Africa
Duration: 24 Aug 201429 Aug 2014

Publication series

NameIFAC Proceedings Volumes
PublisherElsevier
Number3
Volume47

Conference

Conference19th IFAC World Congress on International Federation of Automatic Control, IFAC 2014
Country/TerritorySouth Africa
CityCape Town
Period24/08/1429/08/14

Keywords

  • Damping control
  • Force feedback
  • Nanopositioning

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