Single-phase grid connected distributed generation interfacing converter with power quality improvement capability

A. M. Fahmy, K. H. Ahmed, M. S. Hamad, G. P. Adam

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

With the growing of distributed generation penetration which feeds single-phase linear and/or nonlinear loads, the utility power quality is affected in terms of low power factor and current harmonics. In this paper, a single-phase DG unit is connected to the grid via a multifunctional converter. The converter exchanges the power with the loads and/or the grid in addition to improving the power quality by acting as a shunt active power filter. A predictive current control technique is used without using a phase locked loop. The proposed system performance is investigated at different operating conditions using a MATLAB/SIMULINK simulation model.

Original languageEnglish
Title of host publicationProceedings, IECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages2169-2174
Number of pages6
ISBN (Print)9781479902248
DOIs
Publication statusPublished - 2013
Event39th Annual Conference of the IEEE Industrial Electronics Society, IECON 2013 - Vienna, Austria
Duration: 10 Nov 201314 Nov 2013

Conference

Conference39th Annual Conference of the IEEE Industrial Electronics Society, IECON 2013
CountryAustria
CityVienna
Period10/11/1314/11/13

Keywords

  • distributed generation
  • power quality
  • predictive current control
  • shunt active power filter

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

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  • Cite this

    Fahmy, A. M., Ahmed, K. H., Hamad, M. S., & Adam, G. P. (2013). Single-phase grid connected distributed generation interfacing converter with power quality improvement capability. In Proceedings, IECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society (pp. 2169-2174). [6699467] Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/IECON.2013.6699467