Texture determination by energy-dispersive XRD

M. A. Player; Z. Shi; S. M. Clark; M. C. Miller; C. C. Tang

doi:10.1016/S0921-4526(98)00272-5

Texture determination by energy-dispersive XRD

M. A. Player^*, Z. Shi, S. M. Clark, M. C. Miller, C. C. Tang

^*Corresponding author for this work

Daresbury Laboratory

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

Abstract

Energy-dispersive X-ray diffraction using synchrotron radiation has a number of advantages for determination of crystallographic texture, and we present an instrument for use on Station 16.4 of the Daresbury SRS, designed primarily for texture studies on surface layers. The instrument allows measurement at low angles of incidence to enhance surface sensitivity. It can typically acquire texture information at 176 (ψ, φ) orientation points in around 2 h, and provides a complete set of pole figures simultaneously.

Original language	English
Pages (from-to)	405-410
Number of pages	6
Journal	Physica B: Condensed Matter
Volume	248
Issue number	1-4
DOIs	https://doi.org/10.1016/S0921-4526(98)00272-5
Publication status	Published - 15 Jun 1998

Bibliographical note

The authors wish to acknowledge EPSRC support under grant GR/J 28032.

Keywords

Energy dispersive
Nickel
Texture
Thin film

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title = "Texture determination by energy-dispersive XRD",

abstract = "Energy-dispersive X-ray diffraction using synchrotron radiation has a number of advantages for determination of crystallographic texture, and we present an instrument for use on Station 16.4 of the Daresbury SRS, designed primarily for texture studies on surface layers. The instrument allows measurement at low angles of incidence to enhance surface sensitivity. It can typically acquire texture information at 176 (ψ, φ) orientation points in around 2 h, and provides a complete set of pole figures simultaneously.",

keywords = "Energy dispersive, Nickel, Texture, Thin film",

author = "Player, {M. A.} and Z. Shi and Clark, {S. M.} and Miller, {M. C.} and Tang, {C. C.}",

note = "The authors wish to acknowledge EPSRC support under grant GR/J 28032. ",

year = "1998",

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day = "15",

doi = "10.1016/S0921-4526(98)00272-5",

language = "English",

volume = "248",

pages = "405--410",

journal = "Physica B: Condensed Matter",

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TY - JOUR

T1 - Texture determination by energy-dispersive XRD

AU - Player, M. A.

AU - Shi, Z.

AU - Clark, S. M.

AU - Miller, M. C.

AU - Tang, C. C.

N1 - The authors wish to acknowledge EPSRC support under grant GR/J 28032.

PY - 1998/6/15

Y1 - 1998/6/15

N2 - Energy-dispersive X-ray diffraction using synchrotron radiation has a number of advantages for determination of crystallographic texture, and we present an instrument for use on Station 16.4 of the Daresbury SRS, designed primarily for texture studies on surface layers. The instrument allows measurement at low angles of incidence to enhance surface sensitivity. It can typically acquire texture information at 176 (ψ, φ) orientation points in around 2 h, and provides a complete set of pole figures simultaneously.

AB - Energy-dispersive X-ray diffraction using synchrotron radiation has a number of advantages for determination of crystallographic texture, and we present an instrument for use on Station 16.4 of the Daresbury SRS, designed primarily for texture studies on surface layers. The instrument allows measurement at low angles of incidence to enhance surface sensitivity. It can typically acquire texture information at 176 (ψ, φ) orientation points in around 2 h, and provides a complete set of pole figures simultaneously.

KW - Energy dispersive

KW - Nickel

KW - Texture

KW - Thin film

UR - http://www.scopus.com/inward/record.url?scp=0032089504&partnerID=8YFLogxK

U2 - 10.1016/S0921-4526(98)00272-5

DO - 10.1016/S0921-4526(98)00272-5

M3 - Article

AN - SCOPUS:0032089504

SN - 0921-4526

VL - 248

SP - 405

EP - 410

JO - Physica B: Condensed Matter

JF - Physica B: Condensed Matter

IS - 1-4

ER -

Texture determination by energy-dispersive XRD

Abstract

Bibliographical note

Keywords

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