Energy-dispersive X-ray diffraction using synchrotron radiation has a number of advantages for determination of crystallographic texture, and we present an instrument for use on Station 16.4 of the Daresbury SRS, designed primarily for texture studies on surface layers. The instrument allows measurement at low angles of incidence to enhance surface sensitivity. It can typically acquire texture information at 176 (ψ, φ) orientation points in around 2 h, and provides a complete set of pole figures simultaneously.
- Energy dispersive
- Thin film
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering