Texture determination by energy-dispersive XRD

M. A. Player*, Z. Shi, S. M. Clark, M. C. Miller, C. C. Tang

*Corresponding author for this work

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

Energy-dispersive X-ray diffraction using synchrotron radiation has a number of advantages for determination of crystallographic texture, and we present an instrument for use on Station 16.4 of the Daresbury SRS, designed primarily for texture studies on surface layers. The instrument allows measurement at low angles of incidence to enhance surface sensitivity. It can typically acquire texture information at 176 (ψ, φ) orientation points in around 2 h, and provides a complete set of pole figures simultaneously.

Original languageEnglish
Pages (from-to)405-410
Number of pages6
JournalPhysica B: Condensed Matter
Volume248
Issue number1-4
DOIs
Publication statusPublished - 15 Jun 1998

Keywords

  • Energy dispersive
  • Nickel
  • Texture
  • Thin film

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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