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The edge cracking and decohesion of thin films
Alfred Rotimi Akisanya
, N. A. Fleck
Engineering
Centre for Energy Transition
Centre for Micro- and Nanomechanics (CEMINACS)
University of Cambridge
Research output
:
Contribution to journal
›
Article
›
peer-review
47
Citations (Scopus)
Overview
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Mathematics
T-stress
100%
Residual Stress
86%
Cracking
85%
Thin Films
73%
Substrate
68%
Crack
56%
Interfacial Crack
47%
Crack Tip
38%
Stress Intensity Factor
33%
Switch
31%
Predict
27%
Angle
24%
Finite Element Method
24%
Path
20%
Physics & Astronomy
residual stress
54%
kinking
43%
edge cracks
41%
stress intensity factors
32%
crack tips
31%
thin films
30%
phase shift
24%
finite element method
24%
switches
24%
cracks
22%
Engineering & Materials Science
Thin films
55%
Residual stresses
51%
Substrates
41%
Cracks
39%
Crack tips
29%
Stress intensity factors
29%
Switches
21%
Finite element method
18%
Chemical Compounds
Residual Stress
77%
Liquid Film
28%