The optical properties of thin erbium films

N. Öncan*, L. Ward, M. A. Player

*Corresponding author for this work

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

The effective dielectric constant, ε′2, of very thin films of erbium on sodium chloride substrates was determined from measurements of normal incidence reflectance and transmittance in the visible spectrum. ε′2 showed a maximum which moved to longer wavelengths as the film thickness increased. Electron microscopy revealed that the film islands grew flatter and more irregular with thickness. The shape factor of the islands, F, was calculated by a modified Maxwell-Garnett method and became smaller as the film thickness increased.

Original languageEnglish
Pages (from-to)361-364
Number of pages4
JournalOptics and Laser Technology
Volume26
Issue number5
DOIs
Publication statusPublished - 1994

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Keywords

  • dielectric constant
  • erbium
  • optical properties
  • thin films

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

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