Variation of preferred orientation of erbium thin films with temperature and substrate

G. R G Craib*, M. A. Player, M. J. Rodman, C. C. Tang

*Corresponding author for this work

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

Pole figures have been collected for erbium thin films (600nm, 1200nm and 200nm thick) grown on molybdenum or glass substrates. These pole figures were collected by an energy dispersive XRD powder camera which was automated so as to provide rotation of the sample around axes parallel to the input beam, and normal to the sample. Additional information can be provided concurrently, namely an evaluation of stresses within the film, approximate crystallite sizing, and film thickness determination. Results show a substantial effect contributed by the substrate on the orientation of the films at ambient deposition temperatures, and the development of strong (002) orientation of films deposited at around 650K substrate temperature, as previously found. Also observed is a mixed fibre texture at both lower temperature (300K) and higher temperature (800K).

Original languageEnglish
Pages (from-to)469-474
Number of pages6
JournalMaterials Science Forum
Volume228-231
Issue numberPart 2
DOIs
Publication statusPublished - 1 Dec 1996

Fingerprint

Erbium
erbium
Thin films
Substrates
poles
thin films
Poles
sizing
Temperature
molybdenum
Molybdenum
temperature
film thickness
textures
cameras
Powders
Film thickness
fibers
evaluation
Textures

Keywords

  • Erbium
  • Texture
  • Thin Film Materials

ASJC Scopus subject areas

  • Materials Science(all)

Cite this

Variation of preferred orientation of erbium thin films with temperature and substrate. / Craib, G. R G; Player, M. A.; Rodman, M. J.; Tang, C. C.

In: Materials Science Forum, Vol. 228-231, No. Part 2, 01.12.1996, p. 469-474.

Research output: Contribution to journalArticle

Craib, G. R G ; Player, M. A. ; Rodman, M. J. ; Tang, C. C. / Variation of preferred orientation of erbium thin films with temperature and substrate. In: Materials Science Forum. 1996 ; Vol. 228-231, No. Part 2. pp. 469-474.
@article{2ebec208bc124187afe1c9f46f60696c,
title = "Variation of preferred orientation of erbium thin films with temperature and substrate",
abstract = "Pole figures have been collected for erbium thin films (600nm, 1200nm and 200nm thick) grown on molybdenum or glass substrates. These pole figures were collected by an energy dispersive XRD powder camera which was automated so as to provide rotation of the sample around axes parallel to the input beam, and normal to the sample. Additional information can be provided concurrently, namely an evaluation of stresses within the film, approximate crystallite sizing, and film thickness determination. Results show a substantial effect contributed by the substrate on the orientation of the films at ambient deposition temperatures, and the development of strong (002) orientation of films deposited at around 650K substrate temperature, as previously found. Also observed is a mixed fibre texture at both lower temperature (300K) and higher temperature (800K).",
keywords = "Erbium, Texture, Thin Film Materials",
author = "Craib, {G. R G} and Player, {M. A.} and Rodman, {M. J.} and Tang, {C. C.}",
year = "1996",
month = "12",
day = "1",
doi = "10.4028/www.scientific.net/MSF.228-231.469",
language = "English",
volume = "228-231",
pages = "469--474",
journal = "Materials Science Forum",
issn = "0255-5476",
publisher = "Trans Tech Publications",
number = "Part 2",

}

TY - JOUR

T1 - Variation of preferred orientation of erbium thin films with temperature and substrate

AU - Craib, G. R G

AU - Player, M. A.

AU - Rodman, M. J.

AU - Tang, C. C.

PY - 1996/12/1

Y1 - 1996/12/1

N2 - Pole figures have been collected for erbium thin films (600nm, 1200nm and 200nm thick) grown on molybdenum or glass substrates. These pole figures were collected by an energy dispersive XRD powder camera which was automated so as to provide rotation of the sample around axes parallel to the input beam, and normal to the sample. Additional information can be provided concurrently, namely an evaluation of stresses within the film, approximate crystallite sizing, and film thickness determination. Results show a substantial effect contributed by the substrate on the orientation of the films at ambient deposition temperatures, and the development of strong (002) orientation of films deposited at around 650K substrate temperature, as previously found. Also observed is a mixed fibre texture at both lower temperature (300K) and higher temperature (800K).

AB - Pole figures have been collected for erbium thin films (600nm, 1200nm and 200nm thick) grown on molybdenum or glass substrates. These pole figures were collected by an energy dispersive XRD powder camera which was automated so as to provide rotation of the sample around axes parallel to the input beam, and normal to the sample. Additional information can be provided concurrently, namely an evaluation of stresses within the film, approximate crystallite sizing, and film thickness determination. Results show a substantial effect contributed by the substrate on the orientation of the films at ambient deposition temperatures, and the development of strong (002) orientation of films deposited at around 650K substrate temperature, as previously found. Also observed is a mixed fibre texture at both lower temperature (300K) and higher temperature (800K).

KW - Erbium

KW - Texture

KW - Thin Film Materials

UR - http://www.scopus.com/inward/record.url?scp=0030397846&partnerID=8YFLogxK

U2 - 10.4028/www.scientific.net/MSF.228-231.469

DO - 10.4028/www.scientific.net/MSF.228-231.469

M3 - Article

AN - SCOPUS:0030397846

VL - 228-231

SP - 469

EP - 474

JO - Materials Science Forum

JF - Materials Science Forum

SN - 0255-5476

IS - Part 2

ER -