A smoothed raster scanning trajectory based on acceleration-continuous B-spline transition for high-speed Atomic Force Microscopy

Linlin Li, Sumeet S. Aphale, Limin Zhu

Research output: Contribution to journalArticlepeer-review

Abstract

The scanning speed of Atomic Force Microscopes (AFMs) is typically limited by the frequency of the triangular trajectory used in generating the raster scan. This is because the higher harmonics of the triangular trajectory have a tendency to excite the mechanical resonances of the nanopositioners incorporated in the AFM, thereby introducing significant positioning errors. To address this issue, this paper proposes a novel scanning trajectory smoothing method to enable high-speed raster scanning. The proposed method utilizes the acceleration-continuous B-spline to replace the backward path of the triangular trajectory for the fast axis. As a result, the advantage of uniform sampling along the forward path is preserved. The trajectory generation process is described in detail. A hysteresis compensation method is employed to improve the tracking performance of the scanner. Experiments conducted on a commercial piezoelectric tube scanner are presented to demonstrate the performance improvement delivered by the proposed method when compared with the traditional raster scanning method. It is shown that the proposed method enables a five-fold improvement in achievable scanning rate, from 10 Hz to 50 Hz.
Original languageEnglish
Article number9095213
Pages (from-to)24-32
Number of pages9
JournalIEEE/ASME Transactions on Mechatronics
Volume26
Issue number1
Early online date18 May 2020
DOIs
Publication statusPublished - Feb 2021

Keywords

  • atomic force microscope
  • trajectory smoothing
  • raster scanning
  • hysteresis compensationn
  • tracking control
  • hysteresis compensation
  • Atomic force microscope

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