An alternative objective microscopic method for the identification of linear enamel hypoplasia (LEH) in the absence of visible perikymata

Highlights
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A new quantitative microscopic method for the identification of LEH is proposed.

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The method relies on enamel surface depth profiles to objectively identify defects.

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It is suitable when there is an absence of visible/continuous perikymata.

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Results compare favorably with existing microscopic and macroscopic methods.

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The method is designed to deal with worn archaeological dental assemblages.