Finding maximally satisfiable terminologies for the description logic ALC

Thomas Meyer*, Kevin Lee, Richard Booth, Jeff Z. Pan

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

52 Citations (Scopus)

Abstract

For ontologies represented as Description Logic Tboxes, optimised DL reasoners are able to detect logical errors, but there is comparatively limited support for resolving such problems. One possible remedy is to weaken the available information to the extent that the errors disappear, but to limit the weakening process as much as possible. The most obvious way to do so is to remove just enough Tbox sentences to eliminate the errors. In this paper we propose a tableau-like procedure for finding maximally concept-satisfiable terminologies represented in the description logic ALC. We discuss some optimisation techniques, and report on preliminary, but encouraging, experimental results.

Original languageEnglish
Title of host publicationProceedings of the 21st National Conference on Artificial Intelligence and the 18th Innovative Applications of Artificial Intelligence Conference, AAAI-06/IAAI-06
Pages269-274
Number of pages6
Volume1
Publication statusPublished - 13 Nov 2006
Event21st National Conference on Artificial Intelligence and the 18th Innovative Applications of Artificial Intelligence Conference, AAAI-06/IAAI-06 - Boston, MA, United States
Duration: 16 Jul 200620 Jul 2006

Conference

Conference21st National Conference on Artificial Intelligence and the 18th Innovative Applications of Artificial Intelligence Conference, AAAI-06/IAAI-06
CountryUnited States
CityBoston, MA
Period16/07/0620/07/06

ASJC Scopus subject areas

  • Software
  • Artificial Intelligence

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  • Cite this

    Meyer, T., Lee, K., Booth, R., & Pan, J. Z. (2006). Finding maximally satisfiable terminologies for the description logic ALC. In Proceedings of the 21st National Conference on Artificial Intelligence and the 18th Innovative Applications of Artificial Intelligence Conference, AAAI-06/IAAI-06 (Vol. 1, pp. 269-274)